Xiaopan is researching the effect of surface roughness on the newly developed form of x-ray absorption spectroscopy (XAS) called inverse partial fluorescence yield (IPFY). As the original theory of IPFY was developed for smooth surfaces, the applicability of IPFY to rough surfaces or porous powder specimens is unclear. Xiaopan’s goal is to find an effective way to model surface roughness effects on IPFY spectra and verify such models with experimental results. He has performed XAS measurements towards this goal at the Canadian Light Source’s SGM beamline.
Xiaopan is also working on studying high temperature cuprate superconductors by resonant soft x-ray scattering and has performed measurements at the Canadian Light Source’s REIXS beamline.